发明名称 Two stage method
摘要 This invention relates to a method for positioning two stages during semiconductor wafer processing. More particularly, the invention facilitates the use of two stages to improve system throughput by decreasing the rest-time of certain system components. While a typical single-stage apparatus requires that each step in the process be performed serially, this invention allows an amount of parallel processing with each stage at different steps of the process, and thus improves system throughput.
申请公布号 US2003076482(A1) 申请公布日期 2003.04.24
申请号 US20010036976 申请日期 2001.10.22
申请人 INOUE FUYUHIKO 发明人 INOUE FUYUHIKO
分类号 G03B27/42;G03F7/20;(IPC1-7):G03B27/42 主分类号 G03B27/42
代理机构 代理人
主权项
地址