发明名称 Evolution of library data sets
摘要 An optical metrology includes a library, a metrology tool and a library evolution tool. The library is generated to include a series of predicted measurements. Each predicted measurement is intended to match the measurements that a metrology device would record when analyzing a corresponding physical structure. The metrology tool compares its empirical measurements to the predicted measurements in the library. If a match is found, the metrology tool extracts a description of the corresponding physical structure from the library. The library evolution tool operates to improve the efficiency of the library. To make these improvements, the library evolution tool statistically analyzes the usage pattern of the library. Based on this analysis, the library evolution tool increases the resolution of commonly used portions of the library. The library evolution tool may also optionally reduce the resolution of less used portions of the library.
申请公布号 US2003076511(A1) 申请公布日期 2003.04.24
申请号 US20020145848 申请日期 2002.05.14
申请人 AIKENS DAVID M.;WEN YOUXIAN;SMITH WALTER LEE 发明人 AIKENS DAVID M.;WEN YOUXIAN;SMITH WALTER LEE
分类号 G01N21/47;G01N21/95;G01N21/956;(IPC1-7):G01B11/04 主分类号 G01N21/47
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