发明名称 Fault detection system
摘要 A fault detection system detecting malfunctions or deteriorations, which may result in an inverter fault, is provided. The system has a temperature sensor installed on a semiconductor module to monitor a temperature rise rate. It is judged that an abnormal condition had occurred if the thermal resistance is increased by the deterioration of a soldering layer of the semiconductor module or by drive circuit malfunctions and, as a result, the relation between an operation mode and the temperature rise rate falls outside a predetermined range.
申请公布号 US2003076232(A1) 申请公布日期 2003.04.24
申请号 US20020098459 申请日期 2002.03.18
申请人 HITACHI, LTD. 发明人 SATO YUTAKA;NAGASU MASAHIRO;ISHIKAWA KATSUMI;SAITO RYUICHI;INARIDA SATORU
分类号 H02M1/00;H02M7/00;H02M7/48;(IPC1-7):G08B17/02 主分类号 H02M1/00
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