发明名称 SINGLE CRYSTAL SILICON WAFER HAVING GETTERING MEANS AND METHOD FOR MAKING THEREOF
摘要 PURPOSE: A single crystal silicon wafer having a gettering means and a method for making thereof are provided to improve the gettering performance by forming a non-defect region without a COP(Crystal Originated Particle) on a surface of a wafer and the fine COP on a back side of the wafer. CONSTITUTION: A crystalline silicon ingot is sliced off. A grinding process and a cleaning process for both sides of the sliced silicon wafer are performed. The remaining damages are removed from a surface of the silicon wafer by performing a chemical etch process. A thermal process is performed under the temperature of 600 to 950 degrees centigrade. A polishing process is performed to remove the remaining crystalline defects. The cleaning process is performed. In the chemical etch process, the wafer is dipped into an etching bath or the chemical etchant is injected to the wafer.
申请公布号 KR20030031616(A) 申请公布日期 2003.04.23
申请号 KR20010063335 申请日期 2001.10.15
申请人 SILTRON INC. 发明人 HWANG, DON HA;LEE, BO YEONG;LEE, DONG GEON;YOO, HAK DO
分类号 H01L21/322;(IPC1-7):H01L21/322 主分类号 H01L21/322
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