发明名称 WAFER POLISHING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a distributed control type wafer polishing device capable of reducing a load on the host computer of a wafer polishing device, eliminating the need of a cable for transfer raw data from an operating part, and controlling utilities such as air, vacuum and water at the use end thereof without using a centralized control by the host computer. SOLUTION: Control equipment for controlling the utilities such as air, vacuum, and water for pressing a wafer 50 against a polishing pad 20 and a microcomputer 46 having a data storage means, calculation means, and input/output means, sending and receiving signals from an external part, and controlling the control equipment are incorporated in a holding head 14 for holding the wafer 50. The microcomputer 46 communicates with the host computer, and controls the utilities at the use end thereof.
申请公布号 JP2003117811(A) 申请公布日期 2003.04.23
申请号 JP20010315031 申请日期 2001.10.12
申请人 TOKYO SEIMITSU CO LTD 发明人 MICHAEL TSUUZOFU
分类号 B24B51/00;B24B37/04;B24B37/07;B24B37/30;H01L21/304 主分类号 B24B51/00
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