| 摘要 |
PROBLEM TO BE SOLVED: To enhance the toggle ratio in the burn-in testing of a functional macros, and to suppress developing time of the burn-in test. SOLUTION: The burn-in test is performed using a memory BIST circuit 202, designed so as to preliminarily perform all tests necessary for confirming the operation of a memory device 201 for not only enhancing the toggle ratio in the burn-in test of the memory device, but also to suppress the developing time of the burn-in testing. Further, by performing the scanning design of the memory BIST circuit 202, the burn-in test of the memory BIST circuit 202 is performed efficiently, and the toggle ratio of the whole of the burn-in test can be enhanced.
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