发明名称 WAFER PLANARIZATION APPARATUS
摘要 The wafer planarization apparatus (1) comprises a processing part (10) which holds a wafer (26) through a protective sheet (T) adhering to the obverse (26B) of the wafer (26) and processes the reverse (26A) of the wafer (26), an inspecting device (22) which inspects the wafer (26) having been processed by the processing part (10), a frame adhering part (108) which adheres a frame (F) through a sheet (S) to the reverse (26A) of the wafer (26) having been inspected by the inspecting device (22), a peeling part (112) which peels the protective sheet (T) from the wafer (26) to which the frame (F) has been adhered, and a transporting device (66, 118) which transports the wafer (26) between the processing part (10), the inspecting device (22), the frame adhering part (108), and the peeling part (112), so that the series of processing for the wafer (26) can be systematized in line. <IMAGE>
申请公布号 SG95694(A1) 申请公布日期 2003.04.23
申请号 SG20020003058 申请日期 2002.05.21
申请人 TOKYO SEIMITSU CO., LTD. 发明人 KAZUO KOBAYASHI
分类号 B24B49/02;B24B7/00;B24B7/04;B24B7/10;B24B37/04;B24B49/00;H01L21/00;H01L21/302;H01L21/304;H01L21/66;H01L21/683;(IPC1-7):H01L21/00 主分类号 B24B49/02
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