发明名称 LENGTH MEASURING METHOD FOR SAMPLE AND SACCNING MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide a length measuring method for a sample in which a length measurement error due to a beam diameter size can be reduced and to provide a scanning microscope. SOLUTION: In the length measuring method for the sample in which the length of a length measuring object on the sample is measured, the length measured value of the length measuring object obtained on the basis of a secondary signal is corrected by a value related to a beam diameter size value.
申请公布号 JP2003121132(A) 申请公布日期 2003.04.23
申请号 JP20010314695 申请日期 2001.10.12
申请人 HITACHI HIGH TECH CORP 发明人 SHIMOMA GOROKU;OTAKA TADASHI;SATO MITSUGI;TODOKORO HIDEO;WATANABE SHUNICHI;TAKAHASHI TADANORI;KAWAKAZU MASAHIRO;GUNJI MASANORI;NISHINO TERUMICHI
分类号 G01B15/00;H01J37/22;H01J37/28;H01L21/66;(IPC1-7):G01B15/00 主分类号 G01B15/00
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