发明名称 |
LENGTH MEASURING METHOD FOR SAMPLE AND SACCNING MICROSCOPE |
摘要 |
PROBLEM TO BE SOLVED: To provide a length measuring method for a sample in which a length measurement error due to a beam diameter size can be reduced and to provide a scanning microscope. SOLUTION: In the length measuring method for the sample in which the length of a length measuring object on the sample is measured, the length measured value of the length measuring object obtained on the basis of a secondary signal is corrected by a value related to a beam diameter size value.
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申请公布号 |
JP2003121132(A) |
申请公布日期 |
2003.04.23 |
申请号 |
JP20010314695 |
申请日期 |
2001.10.12 |
申请人 |
HITACHI HIGH TECH CORP |
发明人 |
SHIMOMA GOROKU;OTAKA TADASHI;SATO MITSUGI;TODOKORO HIDEO;WATANABE SHUNICHI;TAKAHASHI TADANORI;KAWAKAZU MASAHIRO;GUNJI MASANORI;NISHINO TERUMICHI |
分类号 |
G01B15/00;H01J37/22;H01J37/28;H01L21/66;(IPC1-7):G01B15/00 |
主分类号 |
G01B15/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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