发明名称 |
POLARITY-INSPECTING METHOD FOR CHIP-TYPE ELECTRONIC COMPONENT |
摘要 |
PROBLEM TO BE SOLVED: To provide a polarity-inspecting method for chip-type electronic components for reliably and speedily executing the polarity inspection of the polarized chip-type electronic components while being accommodated in the component accommodation section of a strip of transport member. SOLUTION: The polarized chip-type electronic components 8 are retained at a specific position in component accommodation sections 2a-2e of the strip of transport member 1, thus specifying the retention position of the chip-type electronic component 8 by image recognition.
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申请公布号 |
JP2003121369(A) |
申请公布日期 |
2003.04.23 |
申请号 |
JP20010375613 |
申请日期 |
2001.12.10 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
NAKAO SHOZO |
分类号 |
G01R31/26;B65B35/56;B65D85/86;G01N21/84;G01R31/00;(IPC1-7):G01N21/84 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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