发明名称 POLARITY-INSPECTING METHOD FOR CHIP-TYPE ELECTRONIC COMPONENT
摘要 PROBLEM TO BE SOLVED: To provide a polarity-inspecting method for chip-type electronic components for reliably and speedily executing the polarity inspection of the polarized chip-type electronic components while being accommodated in the component accommodation section of a strip of transport member. SOLUTION: The polarized chip-type electronic components 8 are retained at a specific position in component accommodation sections 2a-2e of the strip of transport member 1, thus specifying the retention position of the chip-type electronic component 8 by image recognition.
申请公布号 JP2003121369(A) 申请公布日期 2003.04.23
申请号 JP20010375613 申请日期 2001.12.10
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 NAKAO SHOZO
分类号 G01R31/26;B65B35/56;B65D85/86;G01N21/84;G01R31/00;(IPC1-7):G01N21/84 主分类号 G01R31/26
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