发明名称 |
ELECTRON SPECTROSCOPIC ANALYZER FOR X-RAY FLUORESCENCE |
摘要 |
PURPOSE: An electron spectroscopic analyzer is provided to simultaneously perform an X-ray fluorescence analysis and an X-ray electronic analysis by allowing the X-ray induced electron emission spectroscopy to have functions of an X-ray fluorescence analyzer and an X-ray electronic analyzer. CONSTITUTION: An electron spectroscopic analyzer includes a light source(11) for generating X-ray. A first slit is provided in the X-ray induced electron emission spectroscopy in order to shield an emission of X-ray while allowing X-ray having a predetermined width. A single-crystalline drum(15) is provided in the X-ray induced electron emission spectroscopy. The single-crystalline drum(15) has a plurality of single-crystalline monochrometers for allowing X-ray to be changed into a diffractive wave. A second slit(17) is provided to allow X-ray having a specific energy to pass through. A sample is provided in a sample holder(19).
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申请公布号 |
KR20030031822(A) |
申请公布日期 |
2003.04.23 |
申请号 |
KR20010063718 |
申请日期 |
2001.10.16 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, JAE CHEOL;LIM, CHANG BIN;YURYN., YURYEV |
分类号 |
G01N23/223;(IPC1-7):G01N23/223 |
主分类号 |
G01N23/223 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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