发明名称 MOS device with dual gate insulators and method of forming the same
摘要 A MOS device with dual gate insulators has a first gate insulator formed on a predetermined area of a semiconductor substrate, and a second gate insulator formed outside the predetermined area of the semiconductor substrate to surround the first gate insulator. The second gate insulator is thicker than the first gate insulator. In addition, a gate electrode layer is patterned on the dual gate insulators. The bottom center of the gate electrode layer covers the first gate insulator, and the bottom edge of the gate electrode layer extends to cover the second gate insulator.
申请公布号 US6551883(B1) 申请公布日期 2003.04.22
申请号 US20010026605 申请日期 2001.12.27
申请人 SILICON INTEGRATED SYSTEMS CORP. 发明人 YEN WEN PING;CHEN YUN HSIU;WENG HUNG-CHENG
分类号 H01L21/28;H01L21/8234;H01L29/423;H01L29/51;(IPC1-7):H01L21/476;H01L21/336;H01L21/823 主分类号 H01L21/28
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