发明名称 |
Integrated circuit testing apparatus |
摘要 |
An integrated circuit testing apparatus includes a probe card and a probe unit. The probe unit includes a plurality of conductive elastic bumps and a plurality of conductors positioned to conduct signals from the bumps to the probe card. The testing apparatus can further includes a substrate disposed between the probe card and the probe unit, and a flexible member disposed adjacent the substrate.
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申请公布号 |
US6552555(B1) |
申请公布日期 |
2003.04.22 |
申请号 |
US19990443849 |
申请日期 |
1999.11.19 |
申请人 |
CUSTOM ONE DESIGN, INC. |
发明人 |
NUYTKENS PETER R.;BROMBERG LEV;DANNEN PATRICK G.;MILLER ANDREW D.;MITWALLI AHMED;MOST ROBERT A. |
分类号 |
G01R31/28;(IPC1-7):G01R31/02 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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