发明名称 Tuning absorption levels during laser thermal annealing
摘要 A method of manufacturing a semiconductor device includes forming a gate electrode over a substrate, introducing dopants into the substrate, forming a tuning layer over at least a portion of the substrate, and activating the dopants using laser thermal annealing. The tuning layer causes an increase or a decrease in the amount of fluence absorbed by the portion of substrate below the tuning layer in comparison to an amount of fluence absorbed by a portion of substrate not covered by the tuning layer. Additional tuning layers can also be formed over the substrate.
申请公布号 US6551888(B1) 申请公布日期 2003.04.22
申请号 US20010020496 申请日期 2001.12.18
申请人 ADVANCED MICRO DEVICES, INC. 发明人 TABERY CYRUS E.;PATON ERIC N.;YU BIN;XIANG QI;OGLE ROBERT B.
分类号 H01L21/20;H01L21/268;H01L21/336;(IPC1-7):H01L21/336 主分类号 H01L21/20
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