发明名称 METHOD FOR PROCESSING DEFECT IN HARD DISK DRIVE
摘要 PURPOSE: A method for processing a defect in a hard disk drive is provided to deal with a grown defect after a burn-in test by making out a defect list by adding estimated defect sectors. CONSTITUTION: A burn-in test is executed to make out a log-in list to a cylinder, a head, and sectors in positions where error are generated(21). The duplicated sectors are removed from the list(22). Estimated defect sectors are additionally registered on the log-in list(23). The log-in list is arranged in order of the cylinder, the head, and the sectors(24). A pure defect list is obtained from the arranged log-in list(25). An actual defect list corresponded to a design standard of each company is made out by using the defect list(26).
申请公布号 KR100382717(B1) 申请公布日期 2003.04.21
申请号 KR19960000296 申请日期 1996.01.09
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHO, JIN WON
分类号 G11B19/00;(IPC1-7):G11B19/00 主分类号 G11B19/00
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