DISPLAY DEVICE AND ITS INSPECTION METHOD

摘要

PROBLEM TO BE SOLVED: To provide a display device and its inspection method capable of judging easily whether pixel TFTs (thin film transistors) operate normally or not before liquid crystal elements are formed even in a large-sized panel. SOLUTION: In this display device inspection method, whether pixel TFTs operate normally or not is judged by monitoring potential changes of source signal lines S1 to Sx due to electric discharges of storage capacitors 1001. At that time, respective source lines S1 to Sx are connected respectively to a wiring 1111 for read-out via analog buffers AB1 to ABx in order to reduce the influence of the wiring capacitance CL of the wiring 1111 for read-out at the time of reading out the potential of the source signal lines to the outside of a substrate.