发明名称 SEMICONDUCTOR DEVICE INCLUDING OHMIC CONTACT AND METHOD OF FABRICATING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device including an ohmic contact and a method of fabricating the same device. SOLUTION: A semiconductor device is provided with a substrate, a p-type GaN layer formed on the substrate, and a p-type InXGa1- XN layer on the p-type GaN layer. A good junction surface having a low ohmic contact resistance is formed between the semiconductor and metal electrode. A light emitting device including the ohmic contact is provided with a substrate, a buffer layer formed on the substrate, an n-type covering layer formed on the buffer layer, an active layer formed on the n-type covering layer, a p-type covering layer formed on the active layer, a p-type InXGa1- XN layer formed on the n-type covering layer, and a metal layer formed on the p-type InXGa1- XN layer. A good junction surface having a low ohmic contact resistance is formed between the semiconductor and metal electrode.
申请公布号 JP2003115607(A) 申请公布日期 2003.04.18
申请号 JP20020209988 申请日期 2002.07.18
申请人 SHURAI KAGI KOFUN YUGENKOSHI 发明人 CHANG LIANN-BE;GO HAKUJIN
分类号 H01L21/28;H01L21/285;H01L29/20;H01L29/45;H01L33/14;H01L33/32;H01L33/40;H01S5/042;H01S5/323 主分类号 H01L21/28
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