发明名称 CVD-SiC SELF-SUPPORTED FILM STRUCTURE
摘要 PROBLEM TO BE SOLVED: To provide a CVD-SiC self-supported film structure which restrains deformation such as a warp, improves mechanical strength, is superior in durability, can prevent occurance of foreign particles and is suitable for a semiconductor manufacturing apparatus. SOLUTION: In the CVD-SiC self-supported film structure which is a CVD-SiC compact having a SiC film 2 formed by a CVD method on both surfaces of a SiC substrate 1 formed by the CVD method, an interface of the SiC substrate 1 and the SiC film 2 has such a structure that a SiC crystal 2a composing the SiC film digs into the SiC substrate 1 to a shape of a wedge, a SiC crystal 1a comprising the SiC substrate has an average particle diameter of 15μm or less, and the SiC crystal 2a composing the SiC film has the average particle diameter of 20μm or more but 40μm or less on the interface, and has the average particle diameter of 40μm or more but 200μm or less on the surface of the film.
申请公布号 JP2003113472(A) 申请公布日期 2003.04.18
申请号 JP20010307507 申请日期 2001.10.03
申请人 TOSHIBA CERAMICS CO LTD 发明人 ASAI OSAMU;HAGIWARA HIROTAKA;AZUMA SHINYA;MORI TAKAKAZU
分类号 C04B41/87;C23C16/42;(IPC1-7):C23C16/42 主分类号 C04B41/87
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