发明名称 PATTERN CORRECTING METHOD, AND PATTERN CORRECTING DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide a pattern correcting method, and a pattern correcting device, capable of performing the optimum correction even through glass, and reducing damage to other function films. SOLUTION: A laser beam from a laser 1 is applied through an objective lens 30 with a corrected PDP glass substrate thickness from the reverse side of a pattern formed surface of a glass substrate 64. Patterns for one picture element are linearly cut by the laser beam passing through the substrate to cut off a discharge electrode. Defects in luminescent spots can thus be corrected without damaging a dielectric layer 63.</p>
申请公布号 JP2003115267(A) 申请公布日期 2003.04.18
申请号 JP20010306394 申请日期 2001.10.02
申请人 NTN CORP 发明人 YAMANAKA AKIHIRO;SHIMIZU SHIGEO
分类号 H01J9/50;G09F9/00;H01J11/12;H01J11/22;H01J11/24;H01J11/26;H01J11/34;(IPC1-7):H01J9/50;H01J11/02 主分类号 H01J9/50
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