发明名称 |
PATTERN CORRECTING METHOD, AND PATTERN CORRECTING DEVICE |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a pattern correcting method, and a pattern correcting device, capable of performing the optimum correction even through glass, and reducing damage to other function films. SOLUTION: A laser beam from a laser 1 is applied through an objective lens 30 with a corrected PDP glass substrate thickness from the reverse side of a pattern formed surface of a glass substrate 64. Patterns for one picture element are linearly cut by the laser beam passing through the substrate to cut off a discharge electrode. Defects in luminescent spots can thus be corrected without damaging a dielectric layer 63.</p> |
申请公布号 |
JP2003115267(A) |
申请公布日期 |
2003.04.18 |
申请号 |
JP20010306394 |
申请日期 |
2001.10.02 |
申请人 |
NTN CORP |
发明人 |
YAMANAKA AKIHIRO;SHIMIZU SHIGEO |
分类号 |
H01J9/50;G09F9/00;H01J11/12;H01J11/22;H01J11/24;H01J11/26;H01J11/34;(IPC1-7):H01J9/50;H01J11/02 |
主分类号 |
H01J9/50 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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