发明名称 |
Anti-reflection film, and silica layer |
摘要 |
A main object is to provide an anti-reflection film in which the resistance to wet heat of each thin layer constituting a layer stack is better, the optical properties are excellent, a formation rate is high, and the adherability of each thin layer is excellent. The layer stack in an anti-reflection film is formed by depositing a thin layer formed by a plasma CVD method and a thin layer formed by a sputtering method or a evaporation method. In addition, a silica layer as a low refractive index layer is a prescribed silica layer.
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申请公布号 |
US2003072895(A1) |
申请公布日期 |
2003.04.17 |
申请号 |
US20020229310 |
申请日期 |
2002.08.27 |
申请人 |
SAKAKURA OSAMU;NAKAJIMA TATSUJI |
发明人 |
SAKAKURA OSAMU;NAKAJIMA TATSUJI |
分类号 |
G02B1/11;(IPC1-7):C09K19/00 |
主分类号 |
G02B1/11 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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