发明名称 Electrical resistivity probes
摘要 A miniaturized electrical resistivity (ER) probe based on a known current-voltage (I-V) electrode structure, the Wenner array, is designed for local (point) measurement. A pair of voltage measuring electrodes are positioned between a pair of current carrying electrodes. The electrodes are typically about 1 cm long, separated by 1 cm, so the probe is only about 1 inch long. The electrodes are mounted to a rigid tube with electrical wires in the tube and a sand bag may be placed around the electrodes to protect the electrodes. The probes can be positioned in a borehole or on the surface. The electrodes make contact with the surrounding medium. In a dual mode system, individual probes of a plurality of spaced probes can be used to measure local resistance, i.e. point measurements, but the system can select different probes to make interval measurements between probes and between boreholes.
申请公布号 US2003071604(A1) 申请公布日期 2003.04.17
申请号 US20010976860 申请日期 2001.10.15
申请人 LEE KI HA;BECKER ALEX;FAYBISHENKO BORIS A.;SOLBAU RAY D. 发明人 LEE KI HA;BECKER ALEX;FAYBISHENKO BORIS A.;SOLBAU RAY D.
分类号 G01R27/08;(IPC1-7):G01R31/02 主分类号 G01R27/08
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