发明名称 Compatible embedded DRAM process for MIM capacitor
摘要 A method and system for fabricating a capacitor utilized in a semiconductor device. A salicide gate is designated for use with the semiconductor device. A self-aligned contact (SAC) may also be configured for use with the semiconductor device. The salicide gate and the self-aligned contact are generally in a memory cell area of the semiconductor device to thereby permit the efficient shrinkage of memory cell size without an additional mask or weakening of associated circuit performance. Combining, the self-aligned contact and the salicide gate in the same memory cell area can effectively reduce gate resistance.
申请公布号 US2003073279(A1) 申请公布日期 2003.04.17
申请号 US20010975840 申请日期 2001.10.11
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 CHIANG MIN-HSIUNG
分类号 H01L21/02;H01L21/60;H01L21/768;H01L21/8242;H01L27/108;(IPC1-7):H01L21/824;H01L21/44 主分类号 H01L21/02
代理机构 代理人
主权项
地址