发明名称 |
Compatible embedded DRAM process for MIM capacitor |
摘要 |
A method and system for fabricating a capacitor utilized in a semiconductor device. A salicide gate is designated for use with the semiconductor device. A self-aligned contact (SAC) may also be configured for use with the semiconductor device. The salicide gate and the self-aligned contact are generally in a memory cell area of the semiconductor device to thereby permit the efficient shrinkage of memory cell size without an additional mask or weakening of associated circuit performance. Combining, the self-aligned contact and the salicide gate in the same memory cell area can effectively reduce gate resistance.
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申请公布号 |
US2003073279(A1) |
申请公布日期 |
2003.04.17 |
申请号 |
US20010975840 |
申请日期 |
2001.10.11 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
CHIANG MIN-HSIUNG |
分类号 |
H01L21/02;H01L21/60;H01L21/768;H01L21/8242;H01L27/108;(IPC1-7):H01L21/824;H01L21/44 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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