METHOD FOR READING SEMICONDUCTOR DIE INFORMATION IN A PARALLEL TEST AND BURN-IN SYSTEM

摘要

The present invention defines the number of chip ID fuses (108). A test mode is invoked for the particular chip design being tested causing the chips to output their chip ID's (109). The chip ID is output sequentially until all fuses have been sampled. A first chip ID bit (for each chip being tested) is sampled from the serial output and compared to an expected data (110). The resulting information is interpreted (as above) as a pass or a fail and is stored in a database (112). The method is looped so that each fuse in the chip ID is strobed (114), the interpreted pass/fail results form a binary string. The pass/fail data string (binary chip ID) is loaded into a database.