发明名称 Method of manufacturing a semiconductor device and a semiconductor device
摘要 Over a plug, a stopper insulating film made of an organic film is formed, followed by successive formation of an insulating film and a hard mask. In the presence of a patterned resist film, the hard mask is dry etched, whereby an interconnection groove pattern is transferred thereto. By ashing with oxygen plasma, the resist film is removed to form the interconnection-groove-pattern-transferred hard mask. At this time, the organic film constituting the stopper insulating film has been covered with the insulating film. Then, the insulating film, stopper insulating film and hard mask are removed to form the groove pattern of interconnection. Hydrogen annealing may be conducted after formation of the plug, or the stopper insulating film may be formed over the plug via an adhesion layer.
申请公布号 US2003073317(A1) 申请公布日期 2003.04.17
申请号 US20020298585 申请日期 2002.11.19
申请人 HARA KAZUSATO;FUNATSU KEISUKE;IMAI TOSHINORI;NOGUCHI JUNJI;OHASHI NAOHUMI 发明人 HARA KAZUSATO;FUNATSU KEISUKE;IMAI TOSHINORI;NOGUCHI JUNJI;OHASHI NAOHUMI
分类号 H01L21/311;H01L21/768;H01L23/522;(IPC1-7):H01L21/302;H01L21/461 主分类号 H01L21/311
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