发明名称 Method of and apparatus for developing exposed photoresist to prevent impurity from being attached to wafer surface
摘要 After a silicon wafer is held horizontally such that a surface thereof coated with a photoresist faces upwardly, the surface of the silicon wafer is supplied with a cleaning liquid to form a puddle thereof before a developing liquid is supplied. After the puddle of the cleaning liquid is formed, the silicon wafer starts to be rotated and the developing liquid starts to be supplied to the surface of the silicon wafer. The developing liquid is supplied to the surface of the silicon wafer with the puddle of the cleaning liquid being formed thereon. Alternatively, developing liquid is supplied to the surface of the silicon wafer which is being supplied with cleaning liquid while the silicon wafer is being rotated.
申请公布号 US6548228(B2) 申请公布日期 2003.04.15
申请号 US20010772291 申请日期 2001.01.29
申请人 NEC CORPORATION 发明人 MUTOH AKIRA
分类号 G03F7/30;H01L21/027;(IPC1-7):G03F7/30;G03F7/38 主分类号 G03F7/30
代理机构 代理人
主权项
地址