发明名称 Semiconductor device and method of fabricating the same
摘要 A semiconductor device includes a semiconductor substrate, a gate electrode formed over the semiconductor substrate and a first interlevel insulating layer which is formed over the semiconductor substrate and has first and second contact holes defined by the first interlevel insulating layer. The semiconductor device also includes a first wiring pattern formed in the first contact hole and on the first interlevel insulating layer, a protection layer covering the first wiring pattern and a second interlevel insulating layer which is formed over the first interlevel insulating layer and has a third contact hole defined by the second interlevel insulating layer. The semiconductor device further includes the third contact hole being located on the second contact hole and a second wiring pattern formed in the second and third contact holes and on the second interlevel insulating layer.
申请公布号 US6548845(B1) 申请公布日期 2003.04.15
申请号 US20000662651 申请日期 2000.09.14
申请人 OKI ELECTRIC INDUSTRY CO., LTD. 发明人 KOIKE OSAMU
分类号 H01L23/522;H01L21/768;H01L21/8234;H01L21/8242;H01L27/108;(IPC1-7):H01L21/823 主分类号 H01L23/522
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