发明名称 Compound, high-K, gate and capacitor insulator layer
摘要 A gate or capacitor insulator structure using a first grown oxide layer, a high-k dielectric material on the grown oxide layer, and a deposited oxide layer on the high-k dielectric material. The deposited oxide layer is preferably a densified deposited oxide layer. A conducting layer, such as a gate or capacitor plate, may overlay the densified oxide layer.
申请公布号 US6548854(B1) 申请公布日期 2003.04.15
申请号 US19970995435 申请日期 1997.12.22
申请人 AGERE SYSTEMS INC. 发明人 KIZILYALLI ISIK C.;MA YI;ROY PRADIP KUMAR
分类号 H01L21/02;H01L21/28;H01L29/51;(IPC1-7):H01L29/76 主分类号 H01L21/02
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