发明名称 Apparatus and method for testing for compatibility between circuit boards
摘要 An apparatus and method for comparing identifications of circuit boards in a midplane. When a first circuit board and a second circuit board are inserted into opposite sides of the midplane, an incompatibility between the first circuit board and the second circuit board may damage or impair the operation of one or both of the first circuit board and the second circuit board. To solve this problem, a first identification is stored on the first circuit board and a second identification is stored on the second circuit board. If the first identification of the first circuit board and the second identification of the second circuit board indicate an incompatibility, then one or both of the first circuit board and the second circuit board is/are prevented from fully powering up.
申请公布号 US6549027(B1) 申请公布日期 2003.04.15
申请号 US20000707665 申请日期 2000.11.07
申请人 SUN MICROSYSTEMS, INC. 发明人 MOTT JAMES A.
分类号 H05K7/14;(IPC1-7):G01R1/04 主分类号 H05K7/14
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