发明名称 Method for performing lithographic process to a multi-layered photoresist layer
摘要 A method for performing lithographic process to a multi-layered photoresist layer. The method at least includes the following steps. First of all, a substrate is provided. Then, a first photoresist film is formed on the substrate, and a mask layer is formed on the first photoresist film, wherein the mask layer is different from the first photoresist film. Next, a second photoresist film is formed on the mask layer, and a pattern is transferred into the second photoresist film by using lithographic process. Then, the mask layer is etched by using the second photoresist film as a first mask such that the pattern is transferred into layer. Finally, the pattern is transferred into the first photoresist film by using the mask layer as a second mask.
申请公布号 US6548384(B2) 申请公布日期 2003.04.15
申请号 US20010854959 申请日期 2001.05.14
申请人 MACRONIX INTERNATIONAL CO. LTD 发明人 CHANG CHING-YU
分类号 G03F7/09;G03F7/095;H01L21/027;(IPC1-7):H01L21/22 主分类号 G03F7/09
代理机构 代理人
主权项
地址