发明名称 Multi-thickness silicon films on a single semiconductor-on-insulator (SOI) chip using simox
摘要 A semiconductor-on-insulator (SOI) chip. The SOI chip having a substrate; a buried oxide (BOX) layer disposed on the substrate; and an active layer disposed on the BOX layer, the active layer divided into a first tile and a second tile, the first tile having a first thickness and the second tile having a second thickness, the second thickness being smaller than the first thickness; wherein the BOX layer is formed under the active layer in an area of the first tile by implanting oxygen ions with a first energy level and a first dosage and the BOX layer is formed under the active layer in an area of the second tile by implanting oxygen ions with a second energy level and a second dosage.
申请公布号 US6548369(B1) 申请公布日期 2003.04.15
申请号 US20010812630 申请日期 2001.03.20
申请人 ADVANCED MICRO DEVICES, INC. 发明人 VAN BENTUM RALF
分类号 H01L21/762;H01L21/84;H01L27/12;(IPC1-7):H01L21/76 主分类号 H01L21/762
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