发明名称 CONTACT LINE IN SEMICONDUCTOR DEVICE AND METHOD FOR FORMING THE SAME
摘要 PURPOSE: A contact line in a semiconductor device and a method for forming the same are provided to prevent a leakage current between a contact line and a semiconductor substrate, reducing resistance of the contact line. CONSTITUTION: A gate pattern(130) is formed on the active region of a semiconductor substrate(100). An ion implantation is performed using an ion implantation mask as the gate pattern. An impurity region is formed on the active region. An interlayer dielectric(160) is formed on the entire surface of the resultant structure. A contact hole(170) is formed to expose the active region. An SEG layer is formed on the exposed active region. A silicide layer(190) is formed by a silicidation process. A contact line is formed.
申请公布号 KR20030029211(A) 申请公布日期 2003.04.14
申请号 KR20010061378 申请日期 2001.10.05
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, SI YEONG;HUH, SEONG JUN;KOO, JA HEUM;PARK, JEONG U;YOO, JONG RYEOL;YOON, SEON PIL
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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