发明名称 |
Semiconductor integrated circuit device and method of manufacturing the same |
摘要 |
In a DRAM having information storage capacitative elements over their corresponding bit lines BL, wiring grooves are defined in an insulating film for wire or interconnection formation, which are formed over a gage electrode serving as word lines of the DRAM. Sidewall spacers are formed on their corresponding side walls of the wiring grooves. Each bit line BL and a first layer interconnection composed of a tungsten film are formed so as to be embedded in the wiring grooves whose intervals are respectively narrowed by the sidewall spacers. The bit lines BL are respectively connected to a semiconductor substrate through connecting plugs. The bit lines BL and the connecting plugs are respectively connected to one another at the bottoms of the wiring grooves.
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申请公布号 |
US2003068857(A1) |
申请公布日期 |
2003.04.10 |
申请号 |
US20020294712 |
申请日期 |
2002.11.15 |
申请人 |
SHUKURI SHOJI;KURODA KENICHI |
发明人 |
SHUKURI SHOJI;KURODA KENICHI |
分类号 |
H01L21/8242;H01L27/108;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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