| 摘要 |
A lateral shearing interferometer wavefront sensor system (10) that employs a double-shear/full aperle-shear/full aperture approach to correct for brawavefront of an optical beam (24) that has been abold>24</highlight>) that has been aberated. The waa lateral shearing interferometer (12) having a bedes a lateral shearing interferometer (<bold>12</hfirst split beam (28) and a second split beam (26)ight>) that splits the beam (<bold>24</highlight>)beam (28) relative to the second split beam (26), d a second split beam (<bold>26</highlight>), a beed split beam (28) and the second split beam (26) first split beam (<bold>28</highlight>) relative tprovides an interference pattern that includes a pd a beam combiner (<bold>16</highlight>) that comb84). A deformable mirror (72) includes a plurality>) and the second split beam (<bold>26</highlight> correct the beam wavefront. The interfered portio combined beam (<bold>30</highlight>) provides an etween actuators (74), or a double shear such thatinterfered beam portions (<bold>76, 78, 82, 84</hin with branch cuts between the actuators (74). t>) includes a plurality of actuators (<bold>74</highlight>) which deform the mirror (<bold>72</highlight>) to correct the beam wavefront. The interfered portions (<bold>76, 78, 82, 84</highlight>) are twice the distance apart between actuators (<bold>74</highlight>), or a double shear such that interfering portions (<bold>76, 78, 82, 84</highlight>) do not align with branch cuts between the actuators (<bold>74</highlight>).
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