发明名称 Method and apparatus for circuit pattern inspection
摘要 The present invention captures images of a circuit chip with a time delay integration or TDI sensor. The circuit chip is on a movable stage which moves at the same rate at which the TDI sensor clocks. A pulsed laser is directed toward the circuit chip and activated in synchronisation with the clock rate of the TDI sensor such that laser is activated when the TDI sensor is imaging the object and the laser is deactivated when the TDI sensor is transferring its charge.
申请公布号 US2003067596(A1) 申请公布日期 2003.04.10
申请号 US20010971847 申请日期 2001.10.05
申请人 LEONARD PATRICK F. 发明人 LEONARD PATRICK F.
分类号 G01N21/956;(IPC1-7):G01N21/88 主分类号 G01N21/956
代理机构 代理人
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