发明名称 |
NON VOLATILE MEMORY CELL STRUCTURE USING MULTILEVEL TRAPPING DIELECTRIC |
摘要 |
A dielectric memory cell (10) comprises a substrate (12) which includes a source region (18), a drain region (20), and a channel region (22) positioned therebetween. A multilevel charge trapping dielectric (14) is positioned on the surface of the substrate (12) and a control gate (16) is positioned on the surface of the dielectric and is positioned over the channel region (22). The multilevel charge trapping dielectric (14) includes a tunneling dielectric (14a) adjacent to the substrate (12), a high dielectric constant capacitive coupling dielectric (14c) adjacent to the control gate (16), and a charge trapping dielectric layer (14b) positioned therebetween.
|
申请公布号 |
WO03030264(A1) |
申请公布日期 |
2003.04.10 |
申请号 |
WO2002US13573 |
申请日期 |
2002.04.30 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
ZHENG, WEI;LI, WENMEI;HALLIYAL, ARVIND;RANDOLPH, MARK, W. |
分类号 |
H01L21/28;H01L29/51;H01L29/792;(IPC1-7):H01L29/51 |
主分类号 |
H01L21/28 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|