发明名称 NON VOLATILE MEMORY CELL STRUCTURE USING MULTILEVEL TRAPPING DIELECTRIC
摘要 A dielectric memory cell (10) comprises a substrate (12) which includes a source region (18), a drain region (20), and a channel region (22) positioned therebetween. A multilevel charge trapping dielectric (14) is positioned on the surface of the substrate (12) and a control gate (16) is positioned on the surface of the dielectric and is positioned over the channel region (22). The multilevel charge trapping dielectric (14) includes a tunneling dielectric (14a) adjacent to the substrate (12), a high dielectric constant capacitive coupling dielectric (14c) adjacent to the control gate (16), and a charge trapping dielectric layer (14b) positioned therebetween.
申请公布号 WO03030264(A1) 申请公布日期 2003.04.10
申请号 WO2002US13573 申请日期 2002.04.30
申请人 ADVANCED MICRO DEVICES, INC. 发明人 ZHENG, WEI;LI, WENMEI;HALLIYAL, ARVIND;RANDOLPH, MARK, W.
分类号 H01L21/28;H01L29/51;H01L29/792;(IPC1-7):H01L29/51 主分类号 H01L21/28
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