| 摘要 |
<p>The invention relates to a device that is used to analyse the structure of a material. The inventive device comprises: probe elements (5) which are used to (i) emit a wave, in the material, with emission delay laws that correspond to several simultaneous deviations and (ii) receive, on the different probe elements (5), signals from the refraction of said wave by the material; detection channels, each detection channel being connected to a probe element (5), in order to collect the refraction signals and to transmit same to data processing means (4); and delay circuits that apply a delay on each detection channel according to the reception delay laws which are predetermined and which correspond to the different deviations of the wave emitted. The invention also relates to an analysis method which can used, in particular, on said device.</p> |
