Testing integrated circuit involves using additional circuit part in intermediate spaces between integrated circuits for separation after testing to control integrated circuit function

摘要

The method involves integrating at least one additional circuit part (3) in the intermediate spaces (4) or cuts between integrated circuits (1) for separation after testing with an external test system (7). The additional circuit part has at least one connecting line (6) directly connected to an associated integrated circuit for controlling a function of the integrated circuit. AN Independent claim is also included for the following: an integrated circuit for implementing the inventive method.