发明名称 Integrated circuit and method
摘要 A via etch to contact a capacitor with ferroelectric between electrodes together with dielectric on an insulating diffusion barrier includes two-step etch with F-based dielectric etch and Cl- and F-based barrier etch.
申请公布号 US2003068846(A1) 申请公布日期 2003.04.10
申请号 US20020223643 申请日期 2002.08.19
申请人 MOISE THEODORE S.;XING GUOQIANG;VISOKAY MARK;GAYNOR JUSTIN F.;GILBERT STEPHEN R.;CELII FRANCIS;SUMMERFELT SCOTT R.;COLOMBO LUIGI 发明人 MOISE THEODORE S.;XING GUOQIANG;VISOKAY MARK;GAYNOR JUSTIN F.;GILBERT STEPHEN R.;CELII FRANCIS;SUMMERFELT SCOTT R.;COLOMBO LUIGI
分类号 H01L21/302;H01L21/02;H01L21/033;H01L21/3065;H01L21/311;H01L21/8242;H01L21/8246;H01L27/115;(IPC1-7):H01L21/823 主分类号 H01L21/302
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