发明名称 DYNAMIC LIGHT SCATTERING MEASURING DEVICE USING LOW COHERENCE INTERFEROMETRY
摘要 <p>PROBLEM TO BE SOLVED: To provide a dynamic light scattering measuring device capable of measuring a dynamic characteristic of a highly concentrated medium based on scattered light from the medium by composing an interferometer by using a low coherence light source and limiting scattering volume. SOLUTION: The dynamic light scattering measuring device is provided with the low coherence light source 2, an objective lens 6 irradiating light condensed from the low coherence light source 2 on a solution, a photodetector 9 measuring scattered light intensity of particles by using a Michelson interferometer, and a spectrum analyzer 10 analyzing a distribution of diffusion coefficients of the particles on the basis of the measured scattered light intensity. Since an interferometer with the low coherence light source 2 is used, only scattered light components from a particular portion substantially equal to an optical path length of light source light is detected.</p>
申请公布号 JP2003106979(A) 申请公布日期 2003.04.09
申请号 JP20010297600 申请日期 2001.09.27
申请人 OTSUKA DENSHI CO LTD 发明人 IWAI TOSHIAKI;ISHII KATSUHIRO;MURAI TAKESHI
分类号 G01N15/02;G01B9/02;G01N15/04;G01N21/49;(IPC1-7):G01N15/02 主分类号 G01N15/02
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