发明名称 Surface modification method for molds used during semiconductor device fabrication
摘要 Surface modifications of a mold used during semiconductor device fabrication provide non-stick characteristics and a mold surface that is resistant to abrasion or wear. Such surface modifications are particularly useful in a mold having a quartz planar surface adapted to contact a photocurable polymer material applied to a semiconductor wafer surface during a fabrication process. The planar surface of the mold is capable of allowing transmission of ultraviolet light therethrough to cure the polymer material. A non-stick film is formed on the planar surface of the mold by a coating or deposition process in order to modify the mold surface. The non-stick film can be formed of a fluoroalkylsilane compound. or a hard material such as diamond or diamond-like carbon. The non-stick film of diamond or diamond-like carbon provides protection against abrasion or wear on the planar surface of the mold. In addition, the non-stick film of diamond or diamond-like carbon can be fluorine-terminated, or can have a coating layer of a fluoroalkylsilane compound formed thereover.
申请公布号 US6544466(B1) 申请公布日期 2003.04.08
申请号 US20000535367 申请日期 2000.03.24
申请人 MICRON TECHNOLOGY 发明人 WESTMORELAND DONALD L.
分类号 B29C33/56;H01L21/56;(IPC1-7):B29C33/58;B29C33/60;B29C35/08;B29C45/14 主分类号 B29C33/56
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