发明名称 |
Embedded eddy current inspection apparatus, system, and method |
摘要 |
An embedded eddy current inspection apparatus includes a substrate having an opening, and a test eddy current coil ("test coil") affixed to the substrate near the opening. An internally inspected multilayer component structure includes an upper layer, a lower layer, and an eddy current probe embedded between the upper and lower layers. The eddy current probe includes the test coil facing a subject layer selected from the upper and lower layers. A method of inspecting a multilayer component structure includes simultaneously energizing the test coil and a reference eddy current coil ("reference coil") embedded between the upper and lower layers and facing the subject layer. The reference coil is located in a reference region of the multilayer structure. A test signal from the test coil is compared with a reference signal from the reference coil, to determine whether a flaw is present in the subject layer near the test coil.
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申请公布号 |
US6545469(B1) |
申请公布日期 |
2003.04.08 |
申请号 |
US20010682902 |
申请日期 |
2001.10.31 |
申请人 |
GENERAL ELECTRIC COMPANY |
发明人 |
BATZINGER THOMAS JAMES;NATH SHRIDHAR CHAMPAKNATH;HERD KENNETH GORDON |
分类号 |
G01N27/90;(IPC1-7):G01N27/90 |
主分类号 |
G01N27/90 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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