发明名称 INSPECTION SYSTEM FOR RF-ID
摘要 PROBLEM TO BE SOLVED: To easily inspect according to the types of RF-ID to cope with a future increase in the types of RF-ID in an inspection system for inspecting the acceptability of the manufactured RF-ID. SOLUTION: When the acceptability of the inspected matter 21X is inspected by the communication with the RF-ID 21 as an inspected matter 21X having at least an antenna 25A and an IC module 25B, a plurality of specified quantity of system side antennas 31 and 32 prepared for each type of the inspected matter 21X are mounted on a drive mechanism 14. These antennas are switched according to the type of the inspected matter 21X, and allowed to communicate with the inspected matter 21X.
申请公布号 JP2003099721(A) 申请公布日期 2003.04.04
申请号 JP20010292079 申请日期 2001.09.25
申请人 TOPPAN FORMS CO LTD 发明人 UMEDA MAKOTO
分类号 B42D15/10;G06K17/00;G06K19/07;H04B1/59;H04B17/00 主分类号 B42D15/10
代理机构 代理人
主权项
地址