发明名称 INSPECTION SYSTEM FOR RF-ID
摘要 PROBLEM TO BE SOLVED: To easily inspect according to the types of RF-ID to cope with a future increase in types of RF-ID in an inspection system for inspecting the acceptability of a manufactured RF-ID. SOLUTION: In this inspection system for RF-ID, the acceptability of an inspected matter is inspected by performing communication with the RF-ID having at least an antenna and an IC module. A holder 31A is mounted on a drive mechanism, and a substrate 42 having a system side antenna 41 for communication with the inspected matter mounted thereon or a case 43 is replaceably held in the specified engagement groove 32 of the holder 31A.
申请公布号 JP2003099719(A) 申请公布日期 2003.04.04
申请号 JP20010292077 申请日期 2001.09.25
申请人 TOPPAN FORMS CO LTD 发明人 HIGUCHI KENSUKE;OKADA TAKAAKI;OYA SHUNSUKE
分类号 B42D15/10;G06K17/00;G06K19/07;H04B1/59;H04B17/00 主分类号 B42D15/10
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