发明名称 |
INSPECTION SYSTEM FOR RF-ID |
摘要 |
PROBLEM TO BE SOLVED: To easily inspect according to the types of RF-ID to cope with a future increase in types of RF-ID in an inspection system for inspecting the acceptability of a manufactured RF-ID. SOLUTION: In this inspection system for RF-ID, the acceptability of an inspected matter is inspected by performing communication with the RF-ID having at least an antenna and an IC module. A holder 31A is mounted on a drive mechanism, and a substrate 42 having a system side antenna 41 for communication with the inspected matter mounted thereon or a case 43 is replaceably held in the specified engagement groove 32 of the holder 31A. |
申请公布号 |
JP2003099719(A) |
申请公布日期 |
2003.04.04 |
申请号 |
JP20010292077 |
申请日期 |
2001.09.25 |
申请人 |
TOPPAN FORMS CO LTD |
发明人 |
HIGUCHI KENSUKE;OKADA TAKAAKI;OYA SHUNSUKE |
分类号 |
B42D15/10;G06K17/00;G06K19/07;H04B1/59;H04B17/00 |
主分类号 |
B42D15/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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