发明名称 MANUFACTURING METHOD FOR NITRIDE SEMICONDUCTOR ELEMENT
摘要 PROBLEM TO BE SOLVED: To provide a nitride semiconductor element of superior operating characteristics by improving quality of crystal in an active region and the peripheral part thereof. SOLUTION: With the temperature of a substrate setting at 1020 deg.C, an n-type clad layer 14 comprising n-type Al0.1 Ga0.9 N, an n-type optical guide layer 15 comprising n-type GaN, and a flatness maintaining layer 16 comprising n-type Al0.2 Ga0.8 N that suppresses re-evaporation of constituting atoms of the n-type optical guide layer 15 to maintain flatness of the surface of the n-type optical guide layer 15 are grown in this order on a substrate 11 comprising sapphire. Then supply of group III source gas is made to stop, the temperature of the substrate is lowered to 780 deg.C, and carrier gas is switched from hydrogen gas to nitrogen gas. Then NH3 , and TMI and TMG are selectively introduced into a group V source and a group III source, respectively, so that an active layer 17 comprising a multiple quantum well structure is grown.
申请公布号 JP2003101148(A) 申请公布日期 2003.04.04
申请号 JP20020262982 申请日期 2002.09.09
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 KIDOGUCHI ISAO;ISHIBASHI AKIHIKO;KUME MASAHIRO;KAMIYAMA SATOSHI;BAN YUZABURO
分类号 H01S5/323;H01S5/343;(IPC1-7):H01S5/323 主分类号 H01S5/323
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