发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 <p>PROBLEM TO BE SOLVED: To permit mass production with respect to a large size glass substrate also by reducing the amount of a catalyst element in the element formation area of a crystallized crystalline silicon film. SOLUTION: A first element or Ni(nickel), promoting the crystallization of an amorphous silicon film, is added to the amorphous silicon film formed on a substrate having an insulating surface, and a first heating treatment is applied to grow the crystal of the amorphous silicon film. Thereafter, a second element having the attracting effect for Ni selectively or P(phosphor) is added to a part of the crystallized amorphous silicon film to make amorphous the area to which P is added. Further, a second heating treatment is applied while retaining at least the area to which P is added and which is made amorphous under a condition that it is not crystallized completely yet, to move the Ni in the crystalline silicon film into the area to which P is added to make the same amorphous, by the second heating treatment and form the active(channel) area of the semiconductor device employing an area except the area to which P is added.</p>
申请公布号 JP2003100630(A) 申请公布日期 2003.04.04
申请号 JP20010285888 申请日期 2001.09.19
申请人 SHARP CORP 发明人 MAKITA NAOKI
分类号 G02F1/1368;H01L21/20;H01L21/322;H01L21/336;H01L29/786;(IPC1-7):H01L21/20;G02F1/136 主分类号 G02F1/1368
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