| 摘要 |
PROBLEM TO BE SOLVED: To burn a fast and highly functional semiconductor device in, in a short time, by adding a converter to a burn-in system. SOLUTION: In this dynamic burn-in system for inputting a signal output from a signal generator 1 into the semiconductor device of a tested object stored in a burn-in vessel 2 to conduct the burn-in for the semiconductor device, the converter 3 is provided in an output side of the signal generator. A frequency of the signal output from the signal generator 1 is made N times by the converter 3, and a burn-in signal output from the converter 3 is input into the semiconductor device of the tested object stored in the vessel 2 to conduct the fast dynamic burn-in. The frequency of the signal output from the signal generator 1 is converted by the converter 3, the burn-in signal of higher frequency is supplied to the semiconductor device in the burn-in vessel, and the dynamic burn-in is allowed thereby even for the fast and highly functional semiconductor device to be conducted in a short time.
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