发明名称 Apparatus for examining an anterior-segment of an eye
摘要 An apparatus for examining an anterior-segment of an eye, capable of grasping each part of the anterior-segment of the eye three-dimensionally and the condition of the center of its pupil accurately. The apparatus is provided with a projection optical system for projecting slit light onto the anterior-segment, which has an optical axis of projection, an image-pickup optical system for picking up a cross-sectional image of the anterior-segment which is optical-sectioned by the projected slit light, which has an optical axis of image-pickup inclined toward the projection optical axis, and comprises an image-pickup lens and an image-pickup device arranged based on the Scheimpflug's rule, rotation means for rotating the projected slit light and the image-pickup optical system about the projection optical axis, and display means for displaying a three-dimensional image of the anterior-segment based on the cross-sectional images picked up at a plurality of angles and the image-pickup angles corresponding to the images.
申请公布号 US2003063258(A1) 申请公布日期 2003.04.03
申请号 US20020261602 申请日期 2002.10.02
申请人 NIDEK CO., LTD. 发明人 TORII MIWAKO;SAITO SETSUO;SUMIYA TOSHIFUMI
分类号 A61B3/10;A61B3/107;A61B3/117;(IPC1-7):A61B3/10 主分类号 A61B3/10
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