发明名称 Measuring chip and method of manufacture thereof
摘要 A method of manufacturing a measuring chip which comprises a dielectric block, and a thin film layer, formed on one surface of the dielectric block, for placing a sample thereon. The dielectric block is formed from resin as a single block whose section parallel to the one surface is a polygon. The single block includes an entrance surface through which a light beam enters the dielectric block, an exit surface through which the light beam emerges from the dielectric block, and the one surface on which the thin film layer is formed. The dielectric block is formed by injection molding, using two half molds whose mating faces are positioned outside two apex angles of the polygon which face each other across the center of the polygon.
申请公布号 US2003062842(A1) 申请公布日期 2003.04.03
申请号 US20020253309 申请日期 2002.09.24
申请人 NOMURA YOSHIMITSU 发明人 NOMURA YOSHIMITSU
分类号 G01N21/03;G01N21/01;G01N21/13;G01N21/27;G01N21/55;G01N35/04;(IPC1-7):H05B41/36 主分类号 G01N21/03
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