发明名称 ELECTRICAL TEST PROBES AND METHODS OF MAKING THE SAME
摘要 <p>A probe plunger (14a, b) and method of making are provided. The probe plunger (14a, b) includes an outer layer (20) of a relatively hard, relatively low contact resistance such as a palladium-cobalt alloy. In some embodiments, a portion of the exterior surface (22) includes at least one region of a self-limiting oxide.</p>
申请公布号 WO2003027689(A1) 申请公布日期 2003.04.03
申请号 US2002030237 申请日期 2002.09.24
申请人 发明人
分类号 主分类号
代理机构 代理人
主权项
地址