发明名称 METHOD FOR THINNING A SILICON WAFER
摘要 <p>The invention concerns a method for thinning a silicon wafer by etching its rear surface. The method consists in carrying out a first partial etching, by mechanical polishing, followed by a chemical etching in one or several solutions, preferably of potassium. The invention also concerns an integrated circuit formed on a wafer thinned by said method, and smart cards comprising such an integrated circuit.</p>
申请公布号 WO2003028077(A1) 申请公布日期 2003.04.03
申请号 FR2002003257 申请日期 2002.09.24
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