发明名称 |
SURFACE INSPECTION METHOD AND DEVICE OF OBJECT USING IMAGE PROCESSING |
摘要 |
PURPOSE: A surface inspection method and device of an object using image processing is provided to execute a surface inspection of the object without a skilled inspector and easily determine a proper wavelength band in obtaining an image. CONSTITUTION: An inspection method for inspecting a surface condition of an object for inspection comprises an illumination optical system(400) including a first light source for irradiating a surface of the object from an oblique direction with first light, and a second light source for irradiating the surface of the object from a substantially perpendicular direction with second light whose principal spectrum range is in longer wavelengths than the first light; an imaging device(200) for capturing a first image including image components relating to at least two color components included in the first light and for capturing a second image relating to the second light; and a region-identifying section for identifying a specific color region having a specific color on the surface of the object on the basis of the first image and the second image.
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申请公布号 |
KR20030026839(A) |
申请公布日期 |
2003.04.03 |
申请号 |
KR20020050707 |
申请日期 |
2002.08.27 |
申请人 |
DAINIPPON SCREEN SEIJO K.K |
发明人 |
SHIOMI JUNICHI;IMAMURA ATSUSHI;SANO HIROSHI;UEMURA HARUO;KANAI TAKAO;FUJIMOTO HIROKI;KOKUBO MASAHIKO;HORIE MASAHIRO |
分类号 |
G01N21/88;G01N21/956;G01R31/309;(IPC1-7):G01N21/88 |
主分类号 |
G01N21/88 |
代理机构 |
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代理人 |
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地址 |
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