发明名称 SURFACE INSPECTION METHOD AND DEVICE OF OBJECT USING IMAGE PROCESSING
摘要 PURPOSE: A surface inspection method and device of an object using image processing is provided to execute a surface inspection of the object without a skilled inspector and easily determine a proper wavelength band in obtaining an image. CONSTITUTION: An inspection method for inspecting a surface condition of an object for inspection comprises an illumination optical system(400) including a first light source for irradiating a surface of the object from an oblique direction with first light, and a second light source for irradiating the surface of the object from a substantially perpendicular direction with second light whose principal spectrum range is in longer wavelengths than the first light; an imaging device(200) for capturing a first image including image components relating to at least two color components included in the first light and for capturing a second image relating to the second light; and a region-identifying section for identifying a specific color region having a specific color on the surface of the object on the basis of the first image and the second image.
申请公布号 KR20030026839(A) 申请公布日期 2003.04.03
申请号 KR20020050707 申请日期 2002.08.27
申请人 DAINIPPON SCREEN SEIJO K.K 发明人 SHIOMI JUNICHI;IMAMURA ATSUSHI;SANO HIROSHI;UEMURA HARUO;KANAI TAKAO;FUJIMOTO HIROKI;KOKUBO MASAHIKO;HORIE MASAHIRO
分类号 G01N21/88;G01N21/956;G01R31/309;(IPC1-7):G01N21/88 主分类号 G01N21/88
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